Dr. Chaitra U

Senior Staff Scientist

Physics

CURRENT ACADEMIC ROLE & RESPONSIBILITIES

    Role: Senior Staff Scientist

    Responsibilities:

    1. Teaching, 沙巴体育 and Design experiments needed for teaching the PG Course.
    2. Additional Responsibilities: Academic coordinator for Integrated MSc PhD in Physics Programme.

ACADEMIC QUALIFICATIONS

Degree Specialisation Institute Year of passing
Ph. D Thinfilms 沙巴体育 Institute of Technology, MAHE 2019
MSc in Physics Electronics Mangalagangothri, Mangalore University 2004
B.Sc Physics, Mathematics & Computer Science Poornaprajna College udupi 2002

Experience

Institution / Organisation Designation Role Tenure
MIT, Mnaipal Assistant Professor Teaching 2 Years ( 2010 -2012)
Mangalore Institute of Technology (MITE), Moodubidri Senior Assistant Professor Teaching & research 2019 - 2021

AREAS OF INTEREST, EXPERTISE AND RESEARCH

Area of Interest

Thin films, nano materials, Metal oxides

Area of Expertise

Depositing thin films for devices applications

Area of 沙巴体育

Metal oxide based thin films & nano structures for gas sensors

Professional Affiliations & Contributions

  1. ?Life member of " The Indian Society of Technical education"
  2. ?Reviewer for 沙巴体育 journals:? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ?a) Inorganic Chemistry & communication? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ?b) Results in Physics

Determination of optical constants of vacuum annealed ZnO thin films using Wemple Di Domenico model, Sellmier's model and Miller's generalized rules

15/04/2023 Akshayakumar Kompa, B. Lalitha Devi, Chaitra U*

https://doi.org/10.1016/j.matchemphys.2023.127507.

Materials Chemistry and Physics. Vol:299

Influence of starch capping effect on optical absorption and photoluminescence behaviour of ZnS nanoparticles

03/2023 B. Lalitha Devi, U. Chaitra, Shashikanth Hathwara, Akshayakumar Kompa

https://doi.org/10.1016/j.inoche.2022.110374.

Inorganic Chemistry Communications. Vol:149

Highly dense Mn3O4 and CuMn2O4 spinels as efficient protective coatings on solid oxide fuel cell interconnect and their chromium diffusion studies.

15/10/2022 Nayana Acharya, U Chaitra, H Vijeth, Raghavendra Sagar

?https://doi.org/10.1016/j.jallcom.2022.165377?.

Journal of Alloys and Compounds. Vol:918.

Impact of defect sites on the Raman scattering properties of vacuum annealed nitrogen doped ZnO thin films

02/09/2021 U Chaitra

Inorganic Chemistry Communications. Vol:131

Dependence of solution molarity on structural, optical and electrical properties of spin coated ZnO thin films

01/07/2016 U Chaitra Dhananjaya. Kekuda K. Mohan Rao

Journal of Materials Science: Materials in Electronics. Vol:27

Effect of annealing temperature on the evolution of structural, microstructural, and optical properties of spin coated ZnO thin films

02/02/2017 U Chaitra Dhananjaya Kekuda Mohan Rao K

Ceramics 沙巴体育. Vol:43

Effect of doping concentration and annealing temperature on Nitrogen doped ZnO thin films: An investigation through spectroscopic techniques

09/05/2019 U Chaitra Mahesha M. G Dhananjaya Kekuda Mohan Rao K

Applied Physics A. Vol:125

Growth and characterization of undoped and Aluminium doped Zinc Oxide thin films for SO2 gas sensing below threshold value limit

01/12/2019 U Chaitra Muhammed Ali A.V Alison E. Viegas Dhananjaya Kekuda Mohan Rao K

Applied Surface Science. Vol: 496

Property evaluation of spin coated Al doped ZnO thin films and Au/AZO/FTO Schottky diodes

02/07/2021 U. Chaitra Muhammed Ali A.V Mahesha M. G Dhananjaya Kekuda Mohan Rao K

Superlattices and Microstructures. Vol: 155

Investigation on structural, optical and electrical properties of Nd doped titania films and application of optical model

05/01/2021 A.Kompa U. Chaitra Dhananjaya Kekuda Mohan Rao K

Materials Science in Semiconductor Processing. Vol:121